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Master internship - Leuven | More than two weeks ago The data quality in scanning probe microscopy (SPM) is directly linked to the quality of the SPM tip being used. The use of blunt, irregularly shaped, or multiple-contact points tips introduces convolution artifacts that compromise the measurement accuracy, not only in basic imaging but also in the quantitative assessment of material stiffness, surface adhesion, fr…

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Nano-engineered diamond tip chips for advanced imaging and data analysis applications in reverse-tip-sample scanning probe microscopy

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